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Impact of Electrical Stress and Neutron Irradiation on Reliability of Silicon Carbide Power MOSFET

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DOI
10.1109/TNS.2020.2983599
Niskanen, K.; Touboul, A. D.; Coq Germanicus, R.; Michez, A.; Javanainen, A.; Wrobel, F.; Boch, J.; ...
IEEE Transactions on Nuclear Science2020Publicationer information ikon

Effects of Thermal Neutron Irradiation on a Self-Refresh DRAM

DOI
10.1109/DTIS48698.2020.9080918
Luza, Lucas Matana; Söderström, Daniel; Puchner, Helmut; Alía, Ruben Garcia; Letiche, Manon; Bosio, ...
IEEE International Conference on Design and Technology of Integrated Systems in Nanoscale Era2020Publicationer information ikon

Negatiivisesti takaisinkytketty operaatiovahvistin (osa 2)

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Linja-aho, Vesa
Sähkö & Tele2019Publicationer information ikon

Microbeam SEE Analysis of MIM Capacitors for GaN Amplifiers

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DOI
10.1109/TNS.2018.2791564
Kupsc, Pawel; Javanainen, Arto; Ferlet-Cavrois, Véronique; Muschitiello, Michele; Barnes, Andrew; Za...
IEEE Transactions on Nuclear Science2018Publicationer information ikon

Superconductor-ferromagnet hybrids for non-reciprocal electronics and detectors

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DOI
10.1088/1361-6668/ad01e9
Geng, Zhuoran; Hijano, Alberto; Ilic, Stefan; Ilin, Maxim; Maasilta, Ilari J.; Monfardini, Alessandr...
Superconductor Science and Technology2023Publicationer information ikon

Unifying Concepts for Ion-Induced Leakage Current Degradation in Silicon Carbide Schottky Power Diodes

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DOI
10.1109/TNS.2019.2947866
Johnson, R. A.; Witulski, A. F.; Ball, D. R.; Galloway, K. F.; Sternberg, A. L.; Reed, R. A.; Schrim...
IEEE Transactions on Nuclear Science2020Publicationer information ikon

Enhanced Charge Collection in SiC Power MOSFETs Demonstrated by Pulse-Laser Two-Photon Absorption SEE Experiments

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DOI
10.1109/TNS.2019.2922883
Johnson, Robert A.; Witulski, Arthur F.; Ball, Dennis R.; Galloway, Kenneth F.; Sternberg, Andrew L....
IEEE Transactions on Nuclear Science2019Publicationer information ikon

Neutron-induced effects on a self-refresh DRAM

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DOI
10.1016/j.microrel.2021.114406
Matana, Luza Lucas; Söderström, Daniel; Puchner, Helmut; Alía, Rubén García; Letiche, Manon; Cazzani...
Microelectronics Reliability2022Publicationer information ikon

Thermal-to-high-energy neutron SEU characterization of commercial SRAMs

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DOI
10.1109/nsrec45046.2021.9679344
Coronetti, Andrea; Garcia, Alia Ruben; Letiche, Manon; Cazzaniga, Carlo; Kastriotou, Maria; Cecchett...
IEEE Nuclear and Space Radiation Effects Conference2021Publicationer information ikon

Impact of Terrestrial Neutrons on the Reliability of SiC VD-MOSFET Technologies

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DOI
10.1109/TNS.2021.3065122
Martinella, Corinna; Alia, R. G.; Stark, R.; Coronetti, Andrea; Cazzaniga, C.; Kastriotou, M.; Kadi,...
IEEE Transactions on Nuclear Science2021

Impact of Electrical Stress and Neutron Irradiation on Reliability of Silicon Carbide Power MOSFET

Referentgranskad
DOI
10.1109/TNS.2020.2983599
2020

Effects of Thermal Neutron Irradiation on a Self-Refresh DRAM

DOI
10.1109/DTIS48698.2020.9080918
2020

Negatiivisesti takaisinkytketty operaatiovahvistin (osa 2)

Öppen tillgång
2019

Microbeam SEE Analysis of MIM Capacitors for GaN Amplifiers

Referentgranskad
DOI
10.1109/TNS.2018.2791564
2018

Superconductor-ferromagnet hybrids for non-reciprocal electronics and detectors

Referentgranskad
Öppen tillgång
DOI
10.1088/1361-6668/ad01e9
2023

Unifying Concepts for Ion-Induced Leakage Current Degradation in Silicon Carbide Schottky Power Diodes

Referentgranskad
Öppen tillgång
DOI
10.1109/TNS.2019.2947866
2020

Enhanced Charge Collection in SiC Power MOSFETs Demonstrated by Pulse-Laser Two-Photon Absorption SEE Experiments

Referentgranskad
Öppen tillgång
DOI
10.1109/TNS.2019.2922883
2019

Neutron-induced effects on a self-refresh DRAM

Referentgranskad
Öppen tillgång
DOI
10.1016/j.microrel.2021.114406
2022

Thermal-to-high-energy neutron SEU characterization of commercial SRAMs

Referentgranskad
DOI
10.1109/nsrec45046.2021.9679344
2021

Impact of Terrestrial Neutrons on the Reliability of SiC VD-MOSFET Technologies

Referentgranskad
Öppen tillgång
DOI
10.1109/TNS.2021.3065122
2021