NPL Surface Sample preview

Beskrivning

Sample manufactured by National Physical Laboratory by additive manufacturing. The goal of the sample and the measurements was to study the ability of the XCT instrument in measuring surface roughness. Studies were part of the AdvanCT project at VTT MIKES. Preview of PAS-dataset doi:10.23729/df883f74-ab5d-438a-94e2-a3f66f3d63c5
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Publiceringsår

2021

Typ av data

Upphovspersoner

Jukka Kuva Orcid -palvelun logo - Upphovsperson, Utgivare

Ville Heikkinen - Upphovsperson

Projekt

Övriga uppgifter

Vetenskapsområden

Fysik

Språk

Öppen tillgång

Öppet

Licens

Creative Commons Attribution 4.0 International (CC BY 4.0)

Nyckelord

tomography, metrology, surface roughness

Ämnesord

Temporal täckning

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