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Estimating Terrestrial Neutron-Induced SEB Cross-Sections and FIT Rates for High-Voltage SiC Power MOSFETs

Referentgranskad
Öppen tillgång
DOI
10.1109/TNS.2018.2885734
Ball, D. R.; Sierawski, B. D.; Galloway, K. F.; Johnson, R. A.; Alles, M. L.; Sternberg, A. L.; Witu...
IEEE Transactions on Nuclear Science2019

CERN irradiation facilities

Referentgranskad
DOI
10.1093/rpd/ncx187
Pozzi, Fabio; Alia, Ruben Garcia; Brugger, Markus; Carbonez, Pierre; Danzeca, Salvatore; Gkotse, Ble...
Radiation Protection Dosimetry2018

Impact of Electrical Stress and Neutron Irradiation on Reliability of Silicon Carbide Power MOSFET

Referentgranskad
DOI
10.1109/TNS.2020.2983599
Niskanen, K.; Touboul, A. D.; Coq Germanicus, R.; Michez, A.; Javanainen, A.; Wrobel, F.; Boch, J.; ...
IEEE Transactions on Nuclear Science2020

Effects of Thermal Neutron Irradiation on a Self-Refresh DRAM

DOI
10.1109/DTIS48698.2020.9080918
Luza, Lucas Matana; Söderström, Daniel; Puchner, Helmut; Alía, Ruben Garcia; Letiche, Manon; Bosio, ...
IEEE International Conference on Design and Technology of Integrated Systems in Nanoscale Era2020

Investigating the Impact of Radiation-Induced Soft Errors on the Reliability of Approximate Computing Systems

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DOI
10.1109/DFT50435.2020.9250865
Matana Luza, Lucas; Söderström, Daniel; Tsiligiannis, Georgios; Puchner, Helmut; Cazzaniga, Carlo; S...
Proceedings : IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems2020

New exotic beams from the SPIRAL 1 upgrade

Referentgranskad
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DOI
10.1016/j.nimb.2019.04.063
Delahaye, P.; Dubois, M.; Maunoury, L.; Annaluru, A.; Angot, J.; Bajeat, O.; Blank, B.; Cam, J.C.; C...
Nuclear Instruments and Methods in Physics Research Section B : Beam Interactions with Materials and...2020

Mechanisms of Electron-Induced Single Event Latchup

Referentgranskad
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DOI
10.1109/TNS.2018.2884537
Tali, Maris; Alía, Rubéen García; Brugger, Markus; Ferlet-Cavrois, Veronique; Corsini, Roberto; Fara...
IEEE Transactions on Nuclear Science2019

Microbeam SEE Analysis of MIM Capacitors for GaN Amplifiers

Referentgranskad
DOI
10.1109/TNS.2018.2791564
Kupsc, Pawel; Javanainen, Arto; Ferlet-Cavrois, Véronique; Muschitiello, Michele; Barnes, Andrew; Za...
IEEE Transactions on Nuclear Science2018

Failure Estimates for SiC Power MOSFETs in Space Electronics

Referentgranskad
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DOI
10.3390/aerospace5030067
Galloway, Kenneth F.; Witulski, Arthur F.; Schrimpf, Ronald D.; Sternberg, Andrew L.; Ball, Dennis R...
Aerospace2018

Mechanisms of Electron-Induced Single Event Upsets in Medical and Experimental Linacs

Referentgranskad
Öppen tillgång
DOI
10.1109/TNS.2018.2843388
Tali, Maris; Alía, Rubéen García; Brugger, Markus; Ferlet-Cavrois, Veronique; Corsini, Roberto; Fara...
IEEE Transactions on Nuclear Science2018

Estimating Terrestrial Neutron-Induced SEB Cross-Sections and FIT Rates for High-Voltage SiC Power MOSFETs

Referentgranskad
Öppen tillgång
DOI
10.1109/TNS.2018.2885734
2019

CERN irradiation facilities

Referentgranskad
DOI
10.1093/rpd/ncx187
2018

Impact of Electrical Stress and Neutron Irradiation on Reliability of Silicon Carbide Power MOSFET

Referentgranskad
DOI
10.1109/TNS.2020.2983599
2020

Effects of Thermal Neutron Irradiation on a Self-Refresh DRAM

DOI
10.1109/DTIS48698.2020.9080918
2020

Investigating the Impact of Radiation-Induced Soft Errors on the Reliability of Approximate Computing Systems

Öppen tillgång
DOI
10.1109/DFT50435.2020.9250865
2020

New exotic beams from the SPIRAL 1 upgrade

Referentgranskad
Öppen tillgång
DOI
10.1016/j.nimb.2019.04.063
2020

Mechanisms of Electron-Induced Single Event Latchup

Referentgranskad
Öppen tillgång
DOI
10.1109/TNS.2018.2884537
2019

Microbeam SEE Analysis of MIM Capacitors for GaN Amplifiers

Referentgranskad
DOI
10.1109/TNS.2018.2791564
2018

Failure Estimates for SiC Power MOSFETs in Space Electronics

Referentgranskad
Öppen tillgång
DOI
10.3390/aerospace5030067
2018

Mechanisms of Electron-Induced Single Event Upsets in Medical and Experimental Linacs

Referentgranskad
Öppen tillgång
DOI
10.1109/TNS.2018.2843388
2018